JEOL Electron Detector Assembly JWS-7555S Wafer Defect Review SEM Working Spare img{max-width:100%} KLA 710-658177-20 X Interpolator

img{max-width:100%} KLA 710-658177-20 X Interpolator Phase 3 PCB 073-658176-00 2132 Working Spare

Part No: 200021

img{max-width:100%} ASM Advanced Semiconductor Materials 02-30031 Z-Axis Stepping Driver Working

img{max-width:100%} Nikon Precision Fly's Eye Field Lens NSR-S204B Step-and-Repeat Working

5003-200013-11 DUCT(R) (Qty

JEOL Electron Detector Assembly JWS-7555S Wafer Defect Review SEM Working Spare img{max-width:100%} KLA 710-658177-20 X InterpolatorJEOL Electron Detector Assembly JWS 7555S Wafer Defect Review SEM Working Spare Inventory # CONF 1330 Part No: Detector Assembly Removed from a JEOL JWS 7555S Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Electron Detector Assembly JWS 7555S Wafer Defect Review SEM is used working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Used Working, 90 Day Warranty